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Moiré fringe analysis of small precipitates in melt-spun titanium-silicon alloys.

作者信息

Chumbley L S, Fraser H L

机构信息

Department of Materials Science, University of Illinois, Urbana 61801.

出版信息

J Electron Microsc Tech. 1990 Jan;14(1):46-51. doi: 10.1002/jemt.1060140108.

Abstract

Oxygen-contaminated, melt-spun, binary Ti-Si alloys have been examined by using transmission electron microscopy. The microstructure of alloys in the range of 4 to 10% Si (by weight) are cellular and consist primarily of alpha-Ti and the silicide Ti5Si3. Contained only within the Ti5Si3 regions are small, approximately spherical particles which are less than or equal to 10 nm in diameter. Due to their small size, the crystal structure of these particles could not be determined by using conventional diffraction techniques such as Selected Area or Convergent Beam Diffraction. By conducting a number of tilting experiments and observing the moiré fringe patterns produced when various matrix Ti5Si3 planes were used to image the sample, the crystal structure of the particles and the orientation relationship which exists between them and the matrix were deduced. The unknown particles, termed the Z phase, were found to be hexagonal with slightly different lattice parameters from the matrix Ti5Si3. Their relationship with the matrix was such that they appeared to be totally coherent. This may indicate that Z is an oxide based on the intermetallic Ti5Si3.

摘要

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