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比较用于计算半导体弹性性能的应力和总能量方法。

Comparison of stress and total energy methods for calculation of elastic properties of semiconductors.

机构信息

Tyndall National Institute, Dyke Parade, Cork, Ireland.

出版信息

J Phys Condens Matter. 2013 Jan 16;25(2):025803. doi: 10.1088/0953-8984/25/2/025803. Epub 2012 Dec 5.

Abstract

We explore the calculation of the elastic properties of zinc-blende and wurtzite semiconductors using two different approaches: one based on stress and the other on total energy as a function of strain. The calculations are carried out within the framework of density functional theory in the local density approximation, with the plane wave-based package VASP. We use AlN as a test system, with some results also shown for selected other materials (C, Si, GaAs and GaN). Differences are found in convergence rate between the two methods, especially in low symmetry cases, where there is a much slower convergence for total energy calculations with respect to the number of plane waves and k points used. The stress method is observed to be more robust than the total energy method with respect to the residual error in the elastic constants calculated for different strain branches in the systems studied.

摘要

我们探索了使用两种不同方法来计算闪锌矿和纤锌矿半导体的弹性性质

一种基于应力,另一种基于作为应变函数的总能量。这些计算是在局域密度近似的密度泛函理论框架内进行的,使用基于平面波的 VASP 软件包。我们使用 AlN 作为测试系统,还为其他一些选定的材料(C、Si、GaAs 和 GaN)展示了一些结果。在两种方法之间,我们发现了收敛速度的差异,特别是在低对称情况下,总能量计算相对于使用的平面波和 k 点的数量收敛速度要慢得多。与总能量方法相比,在研究系统中不同应变分支计算的弹性常数的残余误差方面,应力方法被观察到更加稳健。

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