Gupta Y M, Turneaure Stefan J, Perkins K, Zimmerman K, Arganbright N, Shen G, Chow P
Institute for Shock Physics and the Department of Physics, Washington State University, Pullman, Washington 99164-2816, USA.
Rev Sci Instrum. 2012 Dec;83(12):123905. doi: 10.1063/1.4772577.
The Advanced Photon Source (APS) at Argonne National Laboratory was used to obtain real-time, high-resolution x-ray diffraction measurements to determine the microscopic response of shock-compressed single crystals. Disk shaped samples were subjected to plane shock wave compression by impacting them with half-inch diameter, flat-faced projectiles. The projectiles were accelerated to velocities ranging between 300 and 1200 m/s using a compact powder gun designed specifically for use at a synchrotron facility. The experiments were designed to keep the sample probed volume under uniaxial strain and constant stress for a duration longer than the 153.4 ns spacing between x-ray bunches. X-rays from a single pulse (<100 ps duration) out of the periodic x-ray pulses emitted by the synchrotron were used for the diffraction measurements. A synchronization and x-ray detection technique was developed to ensure that the measured signal was obtained unambiguously from the desired x-ray pulse incident on the sample while the sample was in a constant uniaxial strain state. The synchronization and x-ray detection techniques described can be used for a variety of x-ray measurements on shock compressed solids and liquids at the APS. Detailed procedures for applying the Bragg-Brentano parafocusing approach to single crystals at the APS are presented. Analytic developments to determine the effects of crystal substructure and non-ideal geometry on the diffraction pattern position and shape are presented. Representative real-time x-ray diffraction data, indicating shock-induced microstructural changes, are presented for a shock-compressed Al(111) sample. The experimental developments presented here provided, in part, the impetus for the Dynamic Compression Sector (DCS) currently under development at the APS. Both the synchronization∕x-ray detection methods and the analysis equations for high-resolution single crystal x-ray diffraction can be used at the DCS.
美国阿贡国家实验室的先进光子源(APS)被用于进行实时、高分辨率的x射线衍射测量,以确定冲击压缩单晶的微观响应。通过用直径半英寸的平面弹丸撞击圆盘形样品,使其受到平面冲击波压缩。使用专门为同步加速器设施设计的紧凑型粉末枪将弹丸加速到300至1200米/秒的速度范围。实验设计旨在使样品探测体积处于单轴应变和恒定应力下的时间超过x射线束之间153.4纳秒的间隔。同步加速器发出的周期性x射线脉冲中的单个脉冲(持续时间<100皮秒)产生的x射线用于衍射测量。开发了一种同步和x射线检测技术,以确保在样品处于恒定单轴应变状态时,从入射到样品上的所需x射线脉冲中明确获得测量信号。所描述的同步和x射线检测技术可用于在APS对冲击压缩的固体和液体进行各种x射线测量。介绍了在APS将布拉格-布伦塔诺聚焦法应用于单晶的详细程序。给出了确定晶体亚结构和非理想几何形状对衍射图案位置和形状影响的分析进展。给出了代表冲击诱导微观结构变化的实时x射线衍射数据,用于冲击压缩的Al(111)样品。这里介绍的实验进展部分地为APS目前正在开发的动态压缩部门(DCS)提供了动力。同步/ x射线检测方法和高分辨率单晶x射线衍射的分析方程都可用于DCS。