School of Physics, The University of New South Wales, Sydney NSW 2052, Australia.
Nano Lett. 2013 Mar 13;13(3):1185-91. doi: 10.1021/nl304607v. Epub 2013 Feb 14.
Axially resolved microphotoluminescence mapping of semiconductor nanowires held in an optical tweezers reveals important new experimental information regarding equilibrium trapping points and trapping stability of high aspect ratio nanostructures. In this study, holographic optical tweezers are used to scan trapped InP nanowires along the beam direction with respect to a fixed excitation source and the luminescent properties are recorded. It is observed that nanowires with lengths on the range of 3-15 μm are stably trapped near the tip of the wire with the long segment positioned below the focus in an inverted trapping configuration. Through the use of trap multiplexing we investigate the possibility of improving the axial stability of the trapped nanowires. Our results have important implication for applications of optically assisted nanowire assembly and optical tweezers based scanning probes microscopy.
轴向分辨微光致发光映射半导体纳米线保持在光学镊子揭示了有关高纵横比纳米结构的平衡俘获点和俘获稳定性的重要新实验信息。在这项研究中，全息光学镊子用于沿着光束方向扫描捕获的 InP 纳米线相对于固定激发源，并且记录发光性质。观察到长度在 3-15 μm 范围内的纳米线稳定地捕获在靠近线的尖端附近，其中长段位于倒置捕获配置中的焦点下方。通过使用陷阱复用，我们研究了提高捕获纳米线轴向稳定性的可能性。我们的结果对于光辅助纳米线组装和基于光学镊子的扫描探针显微镜的应用具有重要意义。
