Department of Physics, Yonsei University, Seoul 120-749, Korea.
Nanoscale. 2013 May 21;5(10):4181-5. doi: 10.1039/c3nr01015e.
We demonstrate logic and static random access memory (SRAM) circuits using a 100 μm long and 100 nm thin single ZnO nanowire (NW), which acts as a channel of field-effect transistors (FETs) with Al2O3 dielectrics. NW FETs are thus arrayed in one dimension to consist of NOT, NAND, and NOR gate logic, and SRAM circuits. Two respective top-gate NW FETs with Au and indium-tin-oxide (ITO) were connected to form an inverter, the basic NOT gate component, since the former gate leads to an enhanced mode FET while the latter to depletion mode due to their work function difference. Our inverters showed a high voltage gain of 22 under a 5 V operational voltage, resulting in successful operation of all other devices. We thus conclude that our long single NW approach is quite promising to extend the field of nano-electronics.
我们使用 100 μm 长、100nm 薄的单根 ZnO 纳米线(NW)展示了逻辑和静态随机存取存储器(SRAM)电路,该 NW 用作带有 Al2O3 电介质的场效应晶体管(FET)的沟道。NW FET 因此以一维方式排列,由 NOT、NAND 和 NOR 门逻辑和 SRAM 电路组成。两个分别带有 Au 和铟锡氧化物(ITO)的顶栅 NW FET 连接在一起形成了反相器,这是基本的 NOT 门元件,因为前者的栅极导致增强模式 FET,而后者由于功函数的差异而导致耗尽模式。我们的反相器在 5V 工作电压下表现出 22 的高电压增益,从而成功地操作了所有其他器件。因此,我们得出结论,我们的长单 NW 方法很有前途,可以扩展纳米电子学领域。