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利用透射电子显微镜实现石墨烯的原子分辨率成像。

Atomic resolution imaging of graphene by transmission electron microscopy.

机构信息

Department of Materials, University of Oxford, OX1 3PH, UK.

出版信息

Nanoscale. 2013 May 21;5(10):4079-93. doi: 10.1039/c3nr00934c.

Abstract

The atomic structure of a material influences its electronic, chemical, magnetic and mechanical properties. Characterising carbon nanomaterials, such as fullerenes, nanotubes and graphene, at the atomic level is challenging due to their chemical reactivity and low atomic mass. Transmission electron microscopy and scanning probe microscopy are two of the leading methods for imaging graphene at the atomic level. Here, we report on recent advances in atomic resolution imaging of graphene using aberration-corrected high resolution transmission electron microscopy and how it has revealed many of the structural deviations from the pristine monolayer form. Structures in graphene such as vacancy defects, edges, grain boundaries, linear chains, impurity dopants, layer number, layer stacking and bond rotations are explored.

摘要

物质的原子结构会影响其电子、化学、磁性和机械性能。由于碳纳米材料(如富勒烯、碳纳米管和石墨烯)的化学活性和低原子质量,在原子水平上对其进行特性描述具有挑战性。透射电子显微镜和扫描探针显微镜是两种用于在原子水平上对石墨烯进行成像的主要方法。在这里,我们报告了使用具有像差校正的高分辨率透射电子显微镜对石墨烯进行原子分辨率成像的最新进展,以及它如何揭示了许多与原始单层形式的结构偏差。本文研究了石墨烯中的结构,如空位缺陷、边缘、晶界、线性链、杂质掺杂剂、层数、层堆积和键旋转。

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