University of Albany, NY 12203, USA.
Microsc Microanal. 2010 Apr;16(2):194-9. doi: 10.1017/S1431927609991309. Epub 2010 Jan 26.
Graphene is a single layer of carbon atoms arranged in a hexagonal lattice. The high carrier mobility and mechanical robustness of single layer graphene make it an attractive material for "beyond CMOS" devices. The current work investigates through high-resolution transmission electron microscopy (HRTEM) image simulation the sensitivity of aberration-corrected HRTEM to the different graphene stacking configurations AAA/ABA/ABC as well as bilayers with rotational misorientations between the individual layers. High-angle annular dark field-scanning transmission electron microscopy simulation is also explored. Images calculated using the multislice approximation show discernable differences between the stacking sequences when simulated with realistic operating parameters in the presence of low random noise.
石墨烯是由单层碳原子以六方晶格排列而成的。单层石墨烯具有较高的载流子迁移率和机械强度，因此成为“超越 CMOS”器件的理想材料。本工作通过高分辨率透射电子显微镜（HRTEM）图像模拟，研究了像差校正 HRTEM 对不同石墨烯堆叠构型 AAA/ABA/ABC 以及层间旋转失配双层结构的灵敏度。还探索了高角环形暗场扫描透射电子显微镜模拟。使用多片近似法计算的图像在存在低随机噪声的情况下，用真实的操作参数模拟时，在不同的堆叠序列之间显示出明显的差异。
