A sub wavelength localization scheme in optical imaging using conical diffraction.

In this paper we present a scheme for the acquisition of high temporal resolution images of single particles with enhanced lateral localization accuracy. The scheme, which is implementable as a part of the illumination system of a standard confocal microscope, is based on the generation of a vector beam that is manipulated by polarimetry techniques to create a set of illumination PSFs with different spatial profiles. The combination of data collected in different illumination states enables the extraction of spatial information obscured by diffraction in the standard imaging system. An implementation of the scheme based on the utilization of the unique phenomenon of conical diffraction is presented, and the basic strategy it provides for enhanced localization in the diffraction limited region is demonstrated.