Departamento de Física, Universidad de Murcia, Campus de Espinardo (CIOyN bldg.), E-30100 Murcia, Spain.
Opt Lett. 2010 Apr 1;35(7):1103-5. doi: 10.1364/OL.35.001103.
A new method, to our knowledge, for real-time direct access to depth information in scanning fluorescence microscopy is reported. It is based on axially exciting the sample and detecting the phase and intensity of the emitted light. Results obtained using an axicon lens to generate a Bessel beam for excitation and a microlens array as phase detector are presented.
我们报道了一种新的方法，可以实时直接获取扫描荧光显微镜中的深度信息。它基于轴向激发样品并检测发射光的相位和强度。本文介绍了使用轴棱锥透镜产生贝塞尔光束进行激发和微透镜阵列作为相位探测器获得的结果。
