Department of Physics, Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, PR China.
Ultramicroscopy. 2013 Jul;130:109-14. doi: 10.1016/j.ultramic.2013.03.011. Epub 2013 Mar 30.
Spin polarized low energy electron microscopy has been used to investigate the quantum size effect (QSE) in electron reflectivity from Fe films grown on a pseudomorphic Cu layer on a W(110) surface. Intensity oscillations caused by the QSE as functions of Fe film thickness and incident electron energy identify quantum well resonance conditions in the film. Evaluation of these intensity oscillations using the phase accumulation model provides information on the unoccupied spin polarized band structure in the Fe film above the vacuum level. We also find evidence that the presence of the non-magnetic Cu layer shifts spin polarized quantum well resonances in the Fe layer uniformly downward in energy by 1.1eV compared to Fe/W(110) films without an interface Cu layer, suggesting that the Cu layer gives a small degree of control over the quantum well resonances.
自旋极化低能电子显微镜已被用于研究在 W(110)表面上的伪晶 Cu 层上生长的 Fe 膜中电子反射的量子尺寸效应 (QSE)。由 QSE 引起的强度振荡作为 Fe 膜厚度和入射电子能量的函数,确定了膜中的量子阱共振条件。使用相位累积模型评估这些强度振荡,提供了真空能级以上 Fe 膜中未占据的自旋极化能带结构的信息。我们还发现证据表明,与没有界面 Cu 层的 Fe/W(110)薄膜相比,非磁性 Cu 层的存在使 Fe 层中的自旋极化量子阱共振均匀地向下移动 1.1eV,这表明 Cu 层对量子阱共振具有一定程度的控制。