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通过在输入平面上平移刻线实现双孔径共光路相移干涉测量。

Double aperture common-path phase-shifting interferometry by translating a ruling at the input plane.

机构信息

Facultad de CienciasFisico-Matematicas, Benemerita Universidad Autonoma de Puebla, Av. San Claudio y 18 Sur, CU San Manuel, Apdo 165, Puebla 72000, Mexico.

出版信息

Opt Lett. 2013 Jun 1;38(11):1850-2. doi: 10.1364/OL.38.001850.

Abstract

A method for introducing phase steps in an interferogram based on translating a ruling at the input plane of a double aperture common-path interferometer is presented. The setup is built on a 4f optical system consisting of two apertures at the input plane and a Ronchi ruling in the Fourier plane, where at each aperture a Ronchi ruling is also placed. By filtering at the Fourier plane a single diffraction order of the spectrum from the rulings in the object plane, we demonstrate that a phase step is generated when one of the rulings in the input plane is translated. The principal advantage of this proposal lies in improving the resolution in the phase step. We develop a theoretical model and show experimental results.

摘要

提出了一种在基于双孔径共路干涉仪输入平面上平移刻线的干涉图中引入相位台阶的方法。该设置建立在由两个孔径在输入平面和傅里叶平面上的朗奇刻线组成的 4f 光学系统上,在每个孔径处也放置一个朗奇刻线。通过在傅里叶平面上对来自物体平面上的刻线的光谱的单个衍射级进行滤波,我们证明了当输入平面上的一个刻线被平移时会产生相位台阶。该提议的主要优点在于提高了相位台阶的分辨率。我们开发了一个理论模型并展示了实验结果。

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