Choi Yoonseuk, Yokoyama Hiroshi, Gwag Jin Seog
Department of Electronics, Hanbat National University, Dongseodaero 125, Yuseong-Gu, Daejeon 305-719, South Korea.
Opt Express. 2013 May 20;21(10):12135-44. doi: 10.1364/OE.21.012135.
Based on several nano-scale groove models, we propose a new technique to simultaneously determine the azimuthal and polar surface anchoring strengths of nematic liquid crystal (LC). The optical analysis of LCs on a grooved surface made by nanoimprinting lithography was performed on special alignment material, using a typical rubbing process. In our approach, using a polarizing microscope, we can determine the LC alignment exactly as it is in a parallel state, rather than a twisted state. This simple proposed method gives an accurate value of the surface LC anchoring of various surfaces, as well as simultaneously measuring the azimuthal and polar anchoring energy.
基于几种纳米级沟槽模型，我们提出了一种新技术，用于同时测定向列型液晶（LC）的方位角和极向表面锚定强度。使用典型的摩擦工艺，在特殊的取向材料上对通过纳米压印光刻制成的沟槽表面上的液晶进行了光学分析。在我们的方法中，使用偏光显微镜，我们可以准确地确定液晶处于平行状态而非扭曲状态时的取向。这种简单的方法能够给出各种表面的表面液晶锚定的准确值，同时测量方位角和极向锚定能。
