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六种一步法自酸蚀粘接系统修复 V 类洞边缘微渗漏的比较。

Marginal microleakage of class V resin-based composite restorations bonded with six one-step self-etch systems.

机构信息

Department of Dentistry, Dental School, Univ Estadual de Ponta Grossa, Ponta Grossa, PR, Brazil.

出版信息

Braz Oral Res. 2013 May-Jun;27(3):225-30. doi: 10.1590/S1806-83242013000300003.

Abstract

This study compared the microleakage of class V restorations bonded with various one-step self-etching adhesives. Seventy class V resin-based composite restorations were prepared on the buccal and lingual surfaces of 35 premolars, by using: Clearfil S3 Bond, G-Bond, iBond, One Coat 7.0, OptiBond All-In-One, or Xeno IV. The Adper Single Bond etch-and-rinse two-step adhesive was employed as a control. Specimens were thermocycled for 500 cycles in separate water baths at 5°C and 55°C and loaded under 40 to 70 N for 50,000 cycles. Marginal microleakage was measured based on the penetration of a tracer agent. Although the control showed no microleakage at the enamel margins, there were no differences between groups (p = 0.06). None of the adhesives avoided microleakage at the dentin margins, and they displayed similar performances (p = 0.76). When both margins were compared, iBond® presented higher microleakage (p < 0.05) at the enamel margins (median, 1.00; Q3-Q1, 1.25-0.00) compared to the dentin margins (median, 0.00; Q3-Q1, 0.25-0.00). The study adhesives showed similar abilities to seal the margins of class V restorations, except for iBond®, which presented lower performance at the enamel margin.

摘要

本研究比较了不同一步自酸蚀黏结剂对 V 类洞修复体微渗漏的影响。在 35 颗前磨牙的颊面和舌面制备 70 个 V 类洞型树脂基复合材料修复体,使用 Clearfil S3 Bond、G-Bond、iBond、One Coat 7.0、OptiBond All-In-One 或 Xeno IV 黏结剂,以 Adper Single Bond 酸蚀-冲洗两步法黏结剂作为对照组。将标本在 5°C 和 55°C 的单独水浴中进行 500 次热循环,然后在 40 至 70 N 下加载 50000 次。根据示踪剂的渗透来测量边缘微渗漏。虽然对照组在釉质边缘没有微渗漏,但组间差异无统计学意义(p = 0.06)。没有一种黏结剂能避免牙本质边缘的微渗漏,且性能相似(p = 0.76)。当比较两个边缘时,iBond® 在釉质边缘的微渗漏更高(p < 0.05)(中位数 1.00;Q3-Q1 1.25-0.00),而在牙本质边缘的微渗漏较低(中位数 0.00;Q3-Q1 0.25-0.00)。除了 iBond® 外,其他研究黏结剂对 V 类洞修复体边缘的密封能力相似,iBond® 在釉质边缘的性能较低。

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