Université de Lorraine, LIBio (Laboratoire d'Ingénierie des Biomolécules), 2 Avenue de la forêt de Haye, TSA 40602, 54518 Vandœuvre-lès-Nancy Cedex, France; Université de Toulouse, Mines Albi, CNRS UMR 5302, Centre RAPSODEE, Campus Jarlard, 81013 Albi cedex 09, France.
Université de Toulouse, Mines Albi, CNRS UMR 5302, Centre RAPSODEE, Campus Jarlard, 81013 Albi cedex 09, France.
Colloids Surf B Biointerfaces. 2013 Nov 1;111:242-51. doi: 10.1016/j.colsurfb.2013.05.025. Epub 2013 May 23.
Energy dispersive X-ray (EDX) is a technique rarely used for organic powders. Nevertheless, this technique is of great interest in the characterization of milk particle surface. In order to validate the method, the EDX technique was tested on pure milk components, on model powders composed of different ratio of lactose/whey proteins and on whole milk powders presenting or not free fat at the surface. For all these powders, satisfactory results were obtained with correct experimental atomic percentages in comparison with expected theoretical percentages. The technique was then applied to skimmed and whole milk powders sieved in 4 fractions. The surface and the core (cut particle) were analyzed by EDX and compared. A relationship between the particle size and the surface composition was observed. X-ray photoelectron spectroscopy (XPS) often used to characterize milk powder surface, however no differences were observed between surface and core composition using this method. The depth of analysis by EDX is far more significant (1 μm) in comparison to that of the XPS (5 nm); hence it was concluded that the analysis of cut particle by EDX was not interesting since too close to the results obtained at the surface. Finally, the technique was coupled with XPS and successful hypothesis concerning composition gradients were done.
能量色散 X 射线(EDX)技术很少用于有机粉末。然而,该技术在牛奶颗粒表面的特性研究中具有很大的兴趣。为了验证该方法,EDX 技术已在纯牛奶成分、不同乳糖/乳清蛋白比例的模型粉末以及表面有或没有游离脂肪的全脂奶粉上进行了测试。对于所有这些粉末,与预期的理论百分比相比,实验原子百分比的结果均令人满意。然后,该技术应用于在 4 个部分过筛的脱脂奶粉和全脂奶粉。通过 EDX 分析并比较了表面和核心(切割颗粒)。观察到颗粒尺寸与表面组成之间的关系。X 射线光电子能谱(XPS)常用于表征奶粉表面,但使用这种方法,在表面和核心组成之间没有观察到差异。EDX 的分析深度(1 μm)远大于 XPS(5 nm);因此,得出结论,通过 EDX 分析切割颗粒没有意义,因为它与表面获得的结果过于接近。最后,该技术与 XPS 相结合,对成分梯度进行了成功的假设。