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采用喷墨打印聚(3,4-亚乙基二氧噻吩):聚(苯乙烯磺酸盐)电极的有机场效应晶体管建模:退火效应研究

Modelling of organic field effect transistors with inkjet printed poly(3,4-ethylenedioxythiophene): poly(styrene sulfonate) electrodes: study of the annealing effects.

作者信息

Grimaldi Immacolata Angelica, Del Mauro Anna de Girolamo, Loffredo Fausta, Morvillo Pasquale, Villani Fulvia

机构信息

Italian National Agency for New Technologies, Energy and Sustainable Economic Development (ENEA), Portici Research Center, Piazzale Enrico Fermi 1, 80055 Portici (Naples), Italy.

出版信息

J Nanosci Nanotechnol. 2013 Jul;13(7):5175-81. doi: 10.1166/jnn.2013.7508.

Abstract

In the present work, the transport mechanism of organic transistors with bottom-gate/top-contact structure, manufactured by employing traditional and inkjet printing techniques, was studied. Poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS) conductive polymer was used for realizing printed source, drain and gate electrodes. The influence of the printing parameters (substrate temperature, drop overlapping degree, drop emission frequency) on the uniformity and morphology of the PEDOT:PSS layer was investigated. Polymethyl methacrylate (PMMA) was used as organic dielectric and pentacene, deposited by thermal evaporation, was employed as p-type semiconductor. Organic field effect transistors (OFETs) were fabricated and electrically characterized before and after the thermal annealing process at 120 degrees C for 1 h in nitrogen ambient. The effect of the annealing on the performances of the OFETs was investigated by modelling the measured electrical characteristics and analyzing them in terms of mobility, characteristic temperature and energy distribution of the density of localized states (DOS). In addition, the OFET working under electrical stress in ambient conditions was observed and discussed.

摘要

在本工作中,研究了采用传统技术和喷墨印刷技术制造的具有底栅/顶接触结构的有机晶体管的传输机制。聚(3,4-乙撑二氧噻吩):聚(苯乙烯磺酸盐)(PEDOT:PSS)导电聚合物用于实现印刷源极、漏极和栅极电极。研究了印刷参数(基板温度、液滴重叠度、液滴发射频率)对PEDOT:PSS层均匀性和形态的影响。聚甲基丙烯酸甲酯(PMMA)用作有机电介质,通过热蒸发沉积的并五苯用作p型半导体。在氮气环境中于120℃热退火1小时前后,制备并对有机场效应晶体管(OFET)进行电学表征。通过对测量的电学特性进行建模,并根据迁移率、特征温度和局域态密度(DOS)的能量分布对其进行分析,研究了退火对OFET性能的影响。此外,还观察并讨论了在环境条件下电应力作用下的OFET。

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