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有损双端口系统的法诺共振公式。

Fano resonance formula for lossy two-port systems.

作者信息

Yoon Jae Woong, Magnusson Robert

机构信息

Department of Electrical Engineering, University of Texas at Arlington, Box 19016, Arlington, TX 76019, USA.

出版信息

Opt Express. 2013 Jul 29;21(15):17751-9. doi: 10.1364/OE.21.017751.

Abstract

We provide a modified Fano resonance formula applicable to dissipative two-port resonance systems. Based on a generic coupled-resonator model, the formula embodies loss-related correction terms and fundamental resonance parameters that can be determined by an analytic method or experimentally as opposed to finding phenomenological parameters by fitting to numerical results. The theory applies physically meaningful resonance parameters including resonance frequency, total decay rates, and partial radiation probabilities. For example, it shows that the classic Fano shape parameter q is given directly in terms of the phase difference between the resonant and non-resonant transmission pathways. Our new resonance formula quantitatively expresses the resonance spectra pertaining to modal nanophotonic and surface-plasmonic thin-film structures as verified by comparing with exact numerical models.

摘要

我们提供了一个适用于耗散双端口共振系统的修正法诺共振公式。基于一个通用的耦合谐振器模型,该公式包含了与损耗相关的修正项和基本共振参数,这些参数可以通过解析方法或实验来确定,而不是通过拟合数值结果来寻找唯象参数。该理论应用了具有物理意义的共振参数,包括共振频率、总衰减率和部分辐射概率。例如,它表明经典的法诺形状参数q直接由共振和非共振传输路径之间的相位差给出。通过与精确数值模型比较验证,我们的新共振公式定量地表达了与模态纳米光子和表面等离子体薄膜结构相关的共振光谱。

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