Institute of Materials Engineering, University of Siegen, Paul-Bonatz-Str. 9-11, 57076 Siegen, Germany.
J Colloid Interface Sci. 2013 Nov 1;409:211-8. doi: 10.1016/j.jcis.2013.07.039. Epub 2013 Aug 6.
Adhesion force between silica microspheres of different sizes and different rough surfaces (silicon and diamond like carbon) has been measured with an atomic force microscope (AFM). Surface roughness, asperity geometry, and size of adhering particles play an important role in determining the adhesion force. Adhesion force linearly increases with size of adhering particle for smooth surfaces and can be described by the JRK model. Adhesion force of adhering particle bigger than in size to the asperities decreases with surface roughness and can be described by the Rabinovich model. For the particles smaller than or similar in size to the asperities, the adhesion force increases with surface roughness. In later case, the interaction of adhering particles with valley portion of asperities is dominated and the contact area increases. On the basis of Rabinovich model, a new equation, which takes the relative size of adhering particles and asperities into account, is derived and compared with experimental results. The normalized adhesion force decreases with ratio of root-mean-square (rms) roughness to radius of adhering particle up to 0.0025, followed by increasing normalized adhesion forces.
使用原子力显微镜（AFM）测量了不同尺寸和不同粗糙表面（硅和类金刚石碳）的二氧化硅微球之间的粘附力。表面粗糙度、粗糙度几何形状和附着颗粒的大小在确定粘附力方面起着重要作用。对于光滑表面，粘附力随附着颗粒的大小线性增加，可以用 JRK 模型来描述。对于大于粗糙度的附着颗粒，粘附力随表面粗糙度的增加而减小，可以用 Rabinovich 模型来描述。对于小于或与粗糙度相似的颗粒，粘附力随表面粗糙度的增加而增加。在后一种情况下，附着颗粒与粗糙度的谷部的相互作用占主导地位，接触面积增加。在 Rabinovich 模型的基础上，推导并比较了一个新的考虑附着颗粒和粗糙度相对大小的方程。归一化粘附力随均方根（rms）粗糙度与附着颗粒半径之比的减小而减小，直到 0.0025，随后归一化粘附力增加。
