Zuo Guoping, Zhou Jianliang, Ke Guotu
School of Nuclear Science and Technology, University of South China, Hengyang, China.
Appl Radiat Isot. 2013 Dec;82:119-25. doi: 10.1016/j.apradiso.2013.07.026. Epub 2013 Aug 8.
A numerical simulation of the energy deposition distribution in semiconductors is performed for ⁶³Ni beta particles. Results show that the energy deposition distribution exhibits an approximate exponential decay law. A simple theoretical model is developed for ⁶³Ni betavoltaic battery based on the distribution characteristics. The correctness of the model is validated by two literature experiments. Results show that the theoretical short-circuit current agrees well with the experimental results, and the open-circuit voltage deviates from the experimental results in terms of the influence of the PN junction defects and the simplification of the source. The theoretical model can be applied to ⁶³Ni and ¹⁴⁷Pm betavoltaic batteries.
针对⁶³Niβ粒子进行了半导体中能量沉积分布的数值模拟。结果表明，能量沉积分布呈现出近似指数衰减规律。基于该分布特性，为⁶³Niβ伏打电池建立了一个简单的理论模型。通过两个文献实验验证了该模型的正确性。结果表明，理论短路电流与实验结果吻合良好，而开路电压在PN结缺陷的影响和源的简化方面与实验结果存在偏差。该理论模型可应用于⁶³Ni和¹⁴⁷Pmβ伏打电池。
