Image Processing Systems Institute of the Russian Academy of Sciences (RAS), Samara, Russia.
Opt Lett. 2013 Sep 1;38(17):3223-6. doi: 10.1364/OL.38.003223.
We study the sharp focusing of differently polarized low-order and high-order beams, including Bessel and Laguerre-Gaussian (LG) modes, to compare them using several criteria: the size of a light spot, the intensity ratio of the central peak and sidelobes, and the intensity of the longitudinal electric field component. The experiments performed using the near-field microscopy techniques are in general agreement with the results of the numerical simulation. We have validated the growth of the longitudinal component in the focus for high-order modes at moderate NA=0.6-0.8, and essential lower sidelobes of Bessel modes, in comparison with LG modes.
我们研究了不同偏振的低阶和高阶光束（包括贝塞尔和拉盖尔-高斯（LG）模式）的锐聚焦，并用几个标准对它们进行了比较：光斑大小、中心峰和旁瓣的强度比，以及纵向电场分量的强度。使用近场显微镜技术进行的实验与数值模拟的结果基本一致。我们验证了在中等数值孔径（NA=0.6-0.8）下，高阶模式在焦点处的纵向分量的增长，以及与 LG 模式相比，贝塞尔模式的旁瓣基本较低。
