Bowes R J, Bennett D H
Pacing Clin Electrophysiol. 1985 Nov;8(6):811-4. doi: 10.1111/j.1540-8159.1985.tb05899.x.
We report on seven patients with implanted pacemakers who underwent transvenous ablation of the atrioventricular junction using direct current shocks of 200 to 350 joules. Pacemaker impulse duration and rate were unaffected, but one rate responsive (TX) pacemaker was reprogrammed by a 300-joule shock. Transient increases in stimulation threshold did occur in two patients, and exit block for 2-15 seconds developed on four occasions. Chronic stimulation thresholds were unaffected. We conclude that it is preferable to carry out ablation before pacemaker implantation, but it is possible to perform transvenous ablation of the atrioventricular junction without damage to an implanted pacemaker; however, a transient rise in stimulation threshold or even exit block may occur, and pacemaker function should be carefully assessed after the procedure.
我们报告了7例植入起搏器的患者，他们接受了使用200至350焦耳直流电冲击的经静脉房室结消融术。起搏器脉冲持续时间和频率未受影响，但一个频率应答型（TX）起搏器被300焦耳的冲击重新编程。两名患者确实出现了刺激阈值的短暂升高，并且有4次出现了2至15秒的出口阻滞。慢性刺激阈值未受影响。我们得出结论，最好在植入起搏器之前进行消融，但也可以在不损坏植入起搏器的情况下进行经静脉房室结消融；然而，可能会出现刺激阈值的短暂升高甚至出口阻滞，术后应仔细评估起搏器功能。
