S. A. Sugar Association Experiment Station, Mount Edgecombe, Private Bag X02, 4300, South Africa.
J Chem Ecol. 1996 Apr;22(4):681-94. doi: 10.1007/BF02033578.
Multiple regression predictive models based on data acquired by near-infrared (NIR) spectrophotometry suggest that stalk surface wax components contribute towards resistance toEldana saccharina Walker in sugarcane. At least 35 sugarcane clones of known resistance were required to calibrate a predictive model that accounted for approximately 54% of the variation in resistance toEldana. Wavelengths chosen in multiple regression models suggest that alcohols and carbonyls are important in the wax contribution. Through the use of wax fractionation and gas chromatography, a high alcohol/aldehyde ratio and shorter carbon chain length appears to be associated with resistance. The use of NIR in the screening of wild germplasm and the early screening of breeding material for resistance, without prior knowledge of the biochemical mechanisms involved, is an exciting prospect. However, cause-and-effect relationships remain to be shown.
基于近红外（NIR）分光光度法获得的数据建立的多元回归预测模型表明，茎秆表面蜡质成分有助于甘蔗对Eldana saccharina Walker 的抗性。至少需要 35 个已知抗性的甘蔗克隆来校准一个预测模型，该模型可以解释约 54%的对 Eldana 的抗性变化。多元回归模型中选择的波长表明，醇和羰基在蜡质贡献中很重要。通过使用蜡质分级和气相色谱，高醇/醛比和较短的碳链长度似乎与抗性有关。在没有涉及的生化机制的先验知识的情况下，使用 NIR 对野生种质资源进行筛选和对抗性育种材料进行早期筛选，这是一个令人兴奋的前景。然而，因果关系仍有待证明。
