School of Advanced Materials Engineering, Kookmin University, 861-1 Jeongneung-dong, Seongbuk-gu, Seoul 136-702, Korea.
Nanotechnology. 2014 Jan 10;25(1):014016. doi: 10.1088/0957-4484/25/1/014016. Epub 2013 Dec 11.
Organic semiconductors have great potential for future electronic applications owing to their inherent flexibility, low cost, light weight and ability to easily cover large areas. However, all of these advantageous material properties can only be harnessed if simple, cheap and low-temperature fabrication processes, which exclude the need for vacuum deposition and are compatible with flexible plastic substrates, are employed. There are a few solution-based techniques such as spin-coating and inkjet printing that meet the above criteria. In this paper, we describe a novel all-solution-processed nonvolatile memory device fabricated on a flexible plastic substrate. The source, drain and gate electrodes were printed using an inkjet printer with a conducting organic solution, while the semiconducting layer was spin-coated with an n-type polymer. The charge-trapping layer was composed of spin-coated reduced graphene oxide (rGO), which was prepared in the form of a solution using Hummer's method. The fabricated device was characterized in order to confirm the memory characteristics. Device parameters such as threshold voltage shift, retention/endurance characteristics, mechanical robustness and reliability upon bending were also analyzed.
有机半导体具有很大的未来电子应用潜力,因为它们具有固有柔韧性、低成本、重量轻和易于覆盖大面积的能力。然而,如果采用简单、廉价且低温的制造工艺,排除真空沉积的需要并且与柔性塑料衬底兼容,那么所有这些有利的材料特性才能被利用。有一些基于溶液的技术,如旋涂和喷墨打印,符合上述标准。在本文中,我们描述了一种在柔性塑料衬底上制造的新型全溶液处理非易失性存储器件。源极、漏极和栅极电极使用喷墨打印机打印导电有机溶液,而半导体层则通过旋涂 n 型聚合物制成。电荷俘获层由旋涂还原氧化石墨烯(rGO)组成,rGO 通过 Hummer 方法制备成溶液形式。为了确认存储特性,对所制造的器件进行了表征。还分析了器件参数,如阈值电压漂移、保留/耐久性特性、机械鲁棒性和弯曲时的可靠性。