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通过飞行时间二次离子质谱法(ToF-SIMS)对电极-电解质界面进行原位化学探测。

In situ chemical probing of the electrode-electrolyte interface by ToF-SIMS.

机构信息

Atmospheric Sciences and Global Climate Change Division, Pacific Northwest National Laboratory, Richland, WA 99354, USA.

出版信息

Lab Chip. 2014 Mar 7;14(5):855-9. doi: 10.1039/c3lc50971k.

Abstract

A portable vacuum interface allowing direct probing of the electrode-electrolyte interface was developed. A classical electrochemical system consisting of a gold working electrode, platinum counter electrode, platinum reference electrode, and potassium iodide electrolyte was used to demonstrate real-time observation of the gold iodide adlayer on the electrode and chemical species as a result of redox reactions using cyclic voltammetry (CV) and time-of-flight secondary ion mass spectrometry (ToF-SIMS, a vacuum-based surface technique) simultaneously. This microfluidic electrochemical probe provides a new way to investigate the surface region with adsorbed molecules and the region of the diffused layer with chemical speciation in liquids in situ by surface sensitive techniques.

摘要

研制了一种便携式真空接口,可直接探测电极-电解质界面。采用经典电化学系统,包括金工作电极、铂对电极、铂参比电极和碘化钾电解质,通过循环伏安法(CV)和飞行时间二次离子质谱(ToF-SIMS,一种基于真空的表面技术)同时实时观察电极上的碘化金吸附加层和氧化还原反应导致的化学物质。这种微流电化学探头为通过表面敏感技术原位研究吸附分子的表面区域和液体中扩散层的化学形态提供了一种新方法。

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