用于高分辨率扫描隧道显微镜的[001]取向钨针尖的制备。

Fabrication of [001]-oriented tungsten tips for high resolution scanning tunneling microscopy.

作者信息

Chaika A N, Orlova N N, Semenov V N, Postnova E Yu, Krasnikov S A, Lazarev M G, Chekmazov S V, Aristov V Yu, Glebovsky V G, Bozhko S I, Shvets I V

机构信息

1] Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow district 142432, Russia [2] Centre for Research on Adaptive Nanostructures and Nanodevices, School of Physics, Trinity College, Dublin 2, Ireland.

Institute of Solid State Physics, Russian Academy of Sciences, Chernogolovka, Moscow district 142432, Russia.

出版信息

Sci Rep. 2014 Jan 17;4:3742. doi: 10.1038/srep03742.

DOI:10.1038/srep03742

PMID:24434734

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC3894555/

Abstract

The structure of the [001]-oriented single crystalline tungsten probes sharpened in ultra-high vacuum using electron beam heating and ion sputtering has been studied using scanning and transmission electron microscopy. The electron microscopy data prove reproducible fabrication of the single-apex tips with nanoscale pyramids grained by the {011} planes at the apexes. These sharp, [001]-oriented tungsten tips have been successfully utilized in high resolution scanning tunneling microscopy imaging of HOPG(0001), SiC(001) and graphene/SiC(001) surfaces. The electron microscopy characterization performed before and after the high resolution STM experiments provides direct correlation between the tip structure and picoscale spatial resolution achieved in the experiments.

摘要

利用扫描电子显微镜和透射电子显微镜研究了在超高真空中通过电子束加热和离子溅射锐化的[001]取向单晶钨探针的结构。电子显微镜数据证明了可重复制造具有纳米级金字塔形状的单尖端，其尖端由{011}平面纹理化。这些尖锐的、[001]取向的钨尖端已成功用于HOPG(0001)、SiC(001)和石墨烯/SiC(001)表面的高分辨率扫描隧道显微镜成像。在高分辨率STM实验之前和之后进行的电子显微镜表征提供了尖端结构与实验中实现的皮米级空间分辨率之间的直接关联。