Rentschler I
Abteilung für Physik und Meteorologie, Laboratorium für Elektronenmikroskopie, der Universität Hohenheim (LH), D-7000, Stuttgart-Hohenheim, Federal Republic of Germany.
Planta. 1974 Jun;117(2):153-61. doi: 10.1007/BF00390797.
The wax structure of plant leaves has been investigated by scanning electron microscopy and with the replica technique by transmission electron microscopy. In addition to replicas of the wax layer, replicas of the leaf surface after removal of the wax have been examined.The wax layer is very thick and felt-like, especially when the plants have been grown at low humidity. In this case the stomatas are also smaller than those of plants grown at high humidity.The amount of transpiration of leaves was correlated to the different formation of the wax layer. Thick and felt-like structure of the wax above the stomatas reduces the water loss considerably. On the other hand all water evaporates from leaves in a short time after removal of the wax.
通过扫描电子显微镜和透射电子显微镜的复型技术对植物叶片的蜡质结构进行了研究。除了蜡质层的复型外，还检查了去除蜡质后的叶片表面复型。蜡质层非常厚且呈毡状，尤其是当植物在低湿度条件下生长时。在这种情况下，气孔也比在高湿度条件下生长的植物的气孔小。叶片的蒸腾量与蜡质层的不同形成有关。气孔上方蜡质的厚且毡状结构大大减少了水分流失。另一方面，去除蜡质后，所有水分会在短时间内从叶片中蒸发。
