Janeček V, Andreotti B, Pražák D, Bárta T, Nikolayev V S
Physique et Mécanique des Milieux Hétérogènes, UMR 7636 ESPCI-CNRS-Université Paris-Diderot-Université P. M. Curie, 10 rue Vauquelin, 75005 Paris, France and ESEME, Service des Basses Températures, UMR-E CEA/UJF-Grenoble 1, INAC, Grenoble, France.
Physique et Mécanique des Milieux Hétérogènes, UMR 7636 ESPCI-CNRS-Université Paris-Diderot-Université P. M. Curie, 10 rue Vauquelin, 75005 Paris, France.
Phys Rev E Stat Nonlin Soft Matter Phys. 2013 Dec;88(6):060404. doi: 10.1103/PhysRevE.88.060404. Epub 2013 Dec 12.
Interfacial flows close to a moving contact line are inherently multiscale. The shape of the interface and the flow at meso- and macroscopic scales inherit an apparent interface slope and a regularization length, both named after Voinov, from the microscopic inner region. Here, we solve the inner problem associated with the contact line motion for a volatile fluid at equilibrium with its vapor. The evaporation or condensation flux is then controlled by the dependence of the saturation temperature on interface curvature-the so-called Kelvin effect. We derive the dependencies of the Voinov angle and of the Voinov length as functions of the parameters of the problem. We then identify the conditions under which the Kelvin effect is indeed the mechanism regularizing the contact line motion.
靠近移动接触线的界面流动本质上是多尺度的。界面的形状以及中观和宏观尺度上的流动从微观内部区域继承了一个表观界面斜率和一个正则化长度,这两者均以沃伊诺夫(Voinov)命名。在此,我们求解与处于与其蒸汽平衡状态的挥发性流体的接触线运动相关的内部问题。然后,蒸发或冷凝通量由饱和温度对界面曲率的依赖性——即所谓的开尔文效应控制。我们推导出沃伊诺夫角和沃伊诺夫长度作为问题参数的函数的依赖性。然后,我们确定开尔文效应确实是使接触线运动正则化的机制的条件。