Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 53, Prague 6, Czech Republic.
Nanoscale. 2014 Apr 7;6(7):3837-45. doi: 10.1039/c3nr06454a.
Silicon nanocrystals (SiNCs) smaller than 5 nm are a material with strong visible photoluminescence (PL). However, the physical origin of the PL, which, in the case of oxide-passivated SiNCs, is typically composed of a slow-decaying red-orange band (S-band) and of a fast-decaying blue-green band (F-band), is still not fully understood. Here we present a physical interpretation of the F-band origin based on the results of an experimental study, in which we combine temperature (4-296 K), temporally (picosecond resolution) and spectrally resolved luminescence spectroscopy of free-standing oxide-passivated SiNCs. Our complex study shows that the F-band red-shifts only by 35 meV with increasing temperature, which is almost 6 times less than the red-shift of the S-band in a similar temperature range. In addition, the F-band characteristic decay time obtained from a stretched-exponential fit decreases only slightly with increasing temperature. These data strongly suggest that the F-band arises from the core-related quasi-direct radiative recombination governed by slowly thermalizing photoholes.
硅纳米晶体(SiNCs)小于 5nm 时具有强烈的可见光光致发光(PL)。然而,PL 的物理起源,在氧化物钝化 SiNCs 的情况下,通常由缓慢衰减的橙红色带(S 带)和快速衰减的蓝绿色带(F 带)组成,仍然没有完全理解。在这里,我们根据实验研究的结果,提出了 F 带起源的物理解释,在该研究中,我们结合了自由-standing 氧化物钝化 SiNCs 的温度(4-296K)、时间(皮秒分辨率)和光谱分辨发光光谱学。我们的综合研究表明,F 带仅随温度升高红移 35meV,这比类似温度范围内 S 带的红移小近 6 倍。此外,从拉伸指数拟合中获得的 F 带特征衰减时间随温度升高仅略有下降。这些数据强烈表明,F 带源于由缓慢热化光空穴控制的与核相关的准直接辐射复合。