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在基于 EGaIn 的隧道结中用 Ag(TS)O(2)C-R 替代 Ag(TS)SCH(2)-R 并不会显著改变电荷输运的速率。

Replacing Ag(TS)SCH(2)-R with Ag(TS)O(2)C-R in EGaIn-based tunneling junctions does not significantly change rates of charge transport.

机构信息

Department of Chemistry and Chemical Biology, Harvard University, 12 Oxford Street, Cambridge, MA 02138 (USA).

出版信息

Angew Chem Int Ed Engl. 2014 Apr 7;53(15):3889-93. doi: 10.1002/anie.201308472. Epub 2014 Mar 5.

DOI:10.1002/anie.201308472
PMID:24596177
Abstract

This paper compares rates of charge transport by tunneling across junctions with the structures Ag(TS) X(CH2 )2n CH3  //Ga2 O3  /EGaIn (n=1-8 and X= SCH2  and O2 C); here Ag(TS) is template-stripped silver, and EGaIn is the eutectic alloy of gallium and indium. Its objective was to compare the tunneling decay coefficient (β, Å(-1) ) and the injection current (J0 , A cm(-2) ) of the junctions comprising SAMs of n-alkanethiolates and n-alkanoates. Replacing Ag(TS) SCH2 -R with Ag(TS) O2 C-R (R=alkyl chains) had no significant influence on J0 (ca. 3×10(3)  A cm(-2) ) or β (0.75-0.79 Å(-1) )-an indication that such changes (both structural and electronic) in the Ag(TS) XR interface do not influence the rate of charge transport. A comparison of junctions comprising oligo(phenylene)carboxylates and n-alkanoates showed, as expected, that β for aliphatic (0.79 Å(-1) ) and aromatic (0.60 Å(-1) ) SAMs differed significantly.

摘要

本文比较了具有 Ag(TS) X(CH2 )2n CH3  //Ga2 O3  /EGaIn 结构的隧穿结的电荷传输速率,其中 X= SCH2  和 O2 C,n=1-8;Ag(TS) 是模板剥离的银,EGaIn 是镓和铟的共晶合金。其目的是比较由 n-巯基烷和 n-烷酸组成的 SAMs 的隧穿衰减系数(β,Å(-1) )和注入电流(J0 ,A cm(-2) )。用 Ag(TS) O2 C-R(R=烷基链)取代 Ag(TS) SCH2 -R 对 J0(约 3×10(3)  A cm(-2) )或 β(0.75-0.79 Å(-1) )没有显著影响,这表明 Ag(TS) XR 界面的这种变化(结构和电子)不会影响电荷传输速率。比较包含聚(苯撑)羧酸酯和 n-烷酸的结,如预期的那样,β 对于脂肪族(0.79 Å(-1) )和芳香族(0.60 Å(-1) )SAM 有显著差异。

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