Takahashi Jun, Kawakami Kazuto, Kobayashi Yukiko
Advanced Technology Research Labs., Nippon Steel & Sumitomo Metal Corporation, 20-1 Shintomi, Futtsu-City, Chiba 293-8511, Japan.
Advanced Technology Research Labs., Nippon Steel & Sumitomo Metal Corporation, 20-1 Shintomi, Futtsu-City, Chiba 293-8511, Japan.
Ultramicroscopy. 2014 May;140:20-5. doi: 10.1016/j.ultramic.2014.01.011. Epub 2014 Feb 15.
We proposed an advanced analysis technique for characterizing a grain boundary using field ion microscopy (FIM) for atom probe analysis. The technique enables quick and precise estimation of the misorientation angle of the grain boundary by matching the calculated crystallographic pole positions with the actual FIM image including the grain boundary. We investigated the accuracy in estimation of the misorientation angle using target grain boundaries which had been analyzed by electron backscatter diffraction pattern (EBSD) analysis. From the comparison between EBSD and FIM analyses, we found that the technique enables the determination of the misorientation angle with a high accuracy of ± 0.4°, which is comparable with that achieved by EBSD.
我们提出了一种先进的分析技术，用于使用场离子显微镜（FIM）进行原子探针分析来表征晶界。该技术通过将计算出的晶体学极位置与包括晶界的实际FIM图像相匹配，能够快速而精确地估计晶界的取向差角。我们使用已通过电子背散射衍射图案（EBSD）分析的目标晶界研究了取向差角估计的准确性。通过EBSD和FIM分析之间的比较，我们发现该技术能够以±0.4°的高精度确定取向差角，这与EBSD所达到的精度相当。
