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基于半导体激光器混沌动力学的两种超快随机比特生成方法。

Two approaches for ultrafast random bit generation based on the chaotic dynamics of a semiconductor laser.

作者信息

Li Nianqiang, Kim Byungchil, Chizhevsky V N, Locquet A, Bloch M, Citrin D S, Pan Wei

出版信息

Opt Express. 2014 Mar 24;22(6):6634-46. doi: 10.1364/OE.22.006634.

DOI:10.1364/OE.22.006634
PMID:24664012
Abstract

This paper reports the experimental investigation of two different approaches to random bit generation based on the chaotic dynamics of a semiconductor laser with optical feedback. By computing high-order finite differences of the chaotic laser intensity time series, we obtain time series with symmetric statistical distributions that are more conducive to ultrafast random bit generation. The first approach is guided by information-theoretic considerations and could potentially reach random bit generation rates as high as 160 Gb/s by extracting 4 bits per sample. The second approach is based on pragmatic considerations and could lead to rates of 2.2 Tb/s by extracting 55 bits per sample. The randomness of the bit sequences obtained from the two approaches is tested against three standard randomness tests (ENT, Diehard, and NIST tests), as well as by calculating the statistical bias and the serial correlation coefficients on longer sequences of random bits than those used in the standard tests.

摘要

本文报道了基于具有光反馈的半导体激光器混沌动力学的两种不同随机比特生成方法的实验研究。通过计算混沌激光强度时间序列的高阶有限差分,我们获得了具有对称统计分布的时间序列,这更有利于超快速随机比特生成。第一种方法是基于信息论考虑,通过每个样本提取4比特,有可能达到高达160 Gb/s的随机比特生成速率。第二种方法基于实际考虑,通过每个样本提取55比特,可能实现2.2 Tb/s的速率。从这两种方法获得的比特序列的随机性通过三种标准随机性测试(ENT、Diehard和NIST测试)进行测试,以及通过计算比标准测试中使用的更长随机比特序列的统计偏差和序列相关系数来测试。

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