High-voltage electron microscopy of E-PTA-stained synaptic junctions in the rat frontal cortex.
作者信息
Igarashi H, Nasu F, Inomata K, Arii T
机构信息
2nd Department of Anatomy, Toho University School of Medicine, Tokyo, Japan.
出版信息
Brain Res. 1988 Nov 15;473(2):365-8. doi: 10.1016/0006-8993(88)90867-0.
PMID:2466527
Abstract
The E-PTA-stained synaptic junctions in the adult rat frontal cortex were examined with high-voltage electron microscopy (HVEM). Perforated whole synaptic junctions were clearly shown in the stereo image. The E-PTA staining procedure provides a useful marker for studies of the 3-dimensional structure of synaptic junctions by means of HVEM.
摘要
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