Kang Woonggi, Jung Minwoo, Cha Wonsuk, Jang Sukjae, Yoon Youngwoon, Kim Hyunjung, Son Hae Jung, Lee Doh-Kwon, Kim BongSoo, Cho Jeong Ho
SKKU Advanced Institute of Nanotechnology (SAINT), School of Chemical Engineering, Sungkyunkwan University , Suwon 440-746, Republic of Korea.
ACS Appl Mater Interfaces. 2014 May 14;6(9):6589-97. doi: 10.1021/am500080p. Epub 2014 Apr 18.
We characterized the electrical properties of a field-effect transistor (FET) and a nonvolatile memory device based on a solution-processable low bandgap small molecule, Si1TDPP-EE-C6. The small molecule consisted of electron-rich thiophene-dithienosilole-thiophene (Si1T) units and electron-deficient diketopyrrolopyrrole (DPP) units. The as-spun Si1TDPP-EE-C6 FET device exhibited ambipolar transport properties with a hole mobility of 7.3×10(-5) cm2/(Vs) and an electron mobility of 1.6×10(-5) cm2/(Vs). Thermal annealing at 110 °C led to a significant increase in carrier mobility, with hole and electron mobilities of 3.7×10(-3) and 5.1×10(-4) cm2/(Vs), respectively. This improvement is strongly correlated with the increased film crystallinity and reduced π-π intermolecular stacking distance upon thermal annealing, revealed by grazing incidence X-ray diffraction (GIXD) and atomic force microscopy (AFM) measurements. In addition, nonvolatile memory devices based on Si1TDPP-EE-C6 were successfully fabricated by incorporating Au nanoparticles (AuNPs) as charge trapping sites at the interface between the silicon oxide (SiO2) and cross-linked poly(4-vinylphenol) (cPVP) dielectrics. The device exhibited reliable nonvolatile memory characteristics, including a wide memory window of 98 V, a high on/off-current ratio of 1×10(3), and good electrical reliability. Overall, we demonstrate that donor-acceptor-type small molecules are a potentially important class of materials for ambipolar FETs and nonvolatile memory applications.
我们表征了基于可溶液加工的低带隙小分子Si1TDPP - EE - C6的场效应晶体管(FET)和非易失性存储器件的电学性质。该小分子由富电子的噻吩 - 二噻吩并硅杂环戊二烯 - 噻吩(Si1T)单元和缺电子的二酮吡咯并吡咯(DPP)单元组成。旋涂的Si1TDPP - EE - C6 FET器件表现出双极性传输特性,空穴迁移率为7.3×10(-5) cm2/(Vs),电子迁移率为1.6×10(-5) cm2/(Vs)。在110°C下进行热退火导致载流子迁移率显著增加,空穴和电子迁移率分别为3.7×10(-3)和5.1×10(-4) cm2/(Vs)。掠入射X射线衍射(GIXD)和原子力显微镜(AFM)测量表明,这种改善与热退火后薄膜结晶度的增加和π - π分子间堆积距离的减小密切相关。此外,通过在氧化硅(SiO2)和交联聚(4 - 乙烯基苯酚)(cPVP)电介质之间的界面处引入金纳米颗粒(AuNPs)作为电荷俘获位点,成功制备了基于Si1TDPP - EE - C6的非易失性存储器件。该器件表现出可靠的非易失性存储特性,包括98 V的宽存储窗口、1×10(3)的高开/关电流比以及良好的电学可靠性。总体而言,我们证明供体 - 受体型小分子是用于双极性FET和非易失性存储应用的潜在重要材料类别。