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用于双极晶体管和非易失性存储器的高结晶性二噻吩并硅杂环戊二烯核小分子半导体。

High crystalline dithienosilole-cored small molecule semiconductor for ambipolar transistor and nonvolatile memory.

作者信息

Kang Woonggi, Jung Minwoo, Cha Wonsuk, Jang Sukjae, Yoon Youngwoon, Kim Hyunjung, Son Hae Jung, Lee Doh-Kwon, Kim BongSoo, Cho Jeong Ho

机构信息

SKKU Advanced Institute of Nanotechnology (SAINT), School of Chemical Engineering, Sungkyunkwan University , Suwon 440-746, Republic of Korea.

出版信息

ACS Appl Mater Interfaces. 2014 May 14;6(9):6589-97. doi: 10.1021/am500080p. Epub 2014 Apr 18.

DOI:10.1021/am500080p
PMID:24708562
Abstract

We characterized the electrical properties of a field-effect transistor (FET) and a nonvolatile memory device based on a solution-processable low bandgap small molecule, Si1TDPP-EE-C6. The small molecule consisted of electron-rich thiophene-dithienosilole-thiophene (Si1T) units and electron-deficient diketopyrrolopyrrole (DPP) units. The as-spun Si1TDPP-EE-C6 FET device exhibited ambipolar transport properties with a hole mobility of 7.3×10(-5) cm2/(Vs) and an electron mobility of 1.6×10(-5) cm2/(Vs). Thermal annealing at 110 °C led to a significant increase in carrier mobility, with hole and electron mobilities of 3.7×10(-3) and 5.1×10(-4) cm2/(Vs), respectively. This improvement is strongly correlated with the increased film crystallinity and reduced π-π intermolecular stacking distance upon thermal annealing, revealed by grazing incidence X-ray diffraction (GIXD) and atomic force microscopy (AFM) measurements. In addition, nonvolatile memory devices based on Si1TDPP-EE-C6 were successfully fabricated by incorporating Au nanoparticles (AuNPs) as charge trapping sites at the interface between the silicon oxide (SiO2) and cross-linked poly(4-vinylphenol) (cPVP) dielectrics. The device exhibited reliable nonvolatile memory characteristics, including a wide memory window of 98 V, a high on/off-current ratio of 1×10(3), and good electrical reliability. Overall, we demonstrate that donor-acceptor-type small molecules are a potentially important class of materials for ambipolar FETs and nonvolatile memory applications.

摘要

我们表征了基于可溶液加工的低带隙小分子Si1TDPP - EE - C6的场效应晶体管(FET)和非易失性存储器件的电学性质。该小分子由富电子的噻吩 - 二噻吩并硅杂环戊二烯 - 噻吩(Si1T)单元和缺电子的二酮吡咯并吡咯(DPP)单元组成。旋涂的Si1TDPP - EE - C6 FET器件表现出双极性传输特性,空穴迁移率为7.3×10(-5) cm2/(Vs),电子迁移率为1.6×10(-5) cm2/(Vs)。在110°C下进行热退火导致载流子迁移率显著增加,空穴和电子迁移率分别为3.7×10(-3)和5.1×10(-4) cm2/(Vs)。掠入射X射线衍射(GIXD)和原子力显微镜(AFM)测量表明,这种改善与热退火后薄膜结晶度的增加和π - π分子间堆积距离的减小密切相关。此外,通过在氧化硅(SiO2)和交联聚(4 - 乙烯基苯酚)(cPVP)电介质之间的界面处引入金纳米颗粒(AuNPs)作为电荷俘获位点,成功制备了基于Si1TDPP - EE - C6的非易失性存储器件。该器件表现出可靠的非易失性存储特性,包括98 V的宽存储窗口、1×10(3)的高开/关电流比以及良好的电学可靠性。总体而言,我们证明供体 - 受体型小分子是用于双极性FET和非易失性存储应用的潜在重要材料类别。

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