Laboratory of Nanotechnology, University of Castilla-La Mancha, Plaza Manuel Meca 1, 13400 Almadén, Spain.
Polymer Nanocomposite Laboratory, Materials Physics Division, School of Advanced Sciences VIT University, Vellore 14, Tamil Nadu, India.
Ultramicroscopy. 2014 Jul;142:32-9. doi: 10.1016/j.ultramic.2014.03.012. Epub 2014 Apr 5.
Atomic Force Microscopy (AFM) and Ultrasonic Force Microscopy (UFM) have been applied to the characterization of composite samples formed by SrTiO3 (STO) nanoparticles (NPs) and polyvinyl alcohol (PVA). The morphological features of the STO NPs were much better resolved using UFM than contact-mode AFM topography. For high STO concentrations the individual STO NPs formed nanoclusters, which gathered in microaggregates. The STO aggregates, covered by PVA, exhibited no AFM frictional contrast, but were clearly distinguished from the PVA matrix using UFM. Similar aggregation was observed for NPs in the composite samples and for NPs deposited on top of a flat silicon substrate from milliQ water solution in the absence of polymer. In the hybrid films, most STO nanoparticles typically presented a lower UFM contrast than the PVA matrix, even though stiffer sample regions such as STO should give rise to a higher UFM contrast. STO NPs with intermediate contrast were characterized by an UFM halo of lower contrast at the PVA/STO interface. The results may be explained by considering that ultrasound is effectively damped on the nanometer scale at PVA/STO interfaces. According to our data, the nanoscale ultrasonic response at the PVA/STO interface plays a fundamental role in the UFM image contrast.
原子力显微镜(AFM)和超声力显微镜(UFM)已应用于 SrTiO3(STO)纳米颗粒(NPs)和聚乙烯醇(PVA)形成的复合材料样品的表征。与接触模式 AFM 形貌相比,UFM 更好地分辨了 STO NPs 的形态特征。对于高 STO 浓度,单个 STO NPs 形成纳米簇,这些纳米簇聚集形成微团聚体。被 PVA 覆盖的 STO 团聚体在 AFM 摩擦对比中没有显示出差异,但在 UFM 中可以明显地区别于 PVA 基质。在复合材料样品中的 NPs 以及在没有聚合物的情况下从 milliQ 水溶液沉积在平坦硅衬底上的 NPs 中观察到了类似的聚集。在混合薄膜中,大多数 STO 纳米颗粒的 UFM 对比度通常低于 PVA 基质,尽管 STO 等较硬的样品区域应产生更高的 UFM 对比度。具有中等对比度的 STO NPs 的特征是在 PVA/STO 界面处具有较低对比度的 UFM 晕环。可以通过考虑到在 PVA/STO 界面处超声在纳米尺度上被有效阻尼来解释这些结果。根据我们的数据,PVA/STO 界面处的纳米级超声响应在 UFM 图像对比度中起着至关重要的作用。