Stan Gheorghe, Gates Richard S
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA.
Nanotechnology. 2014 Jun 20;25(24):245702. doi: 10.1088/0957-4484/25/24/245702. Epub 2014 May 23.
The intermittent contact resonance atomic force microscopy (ICR-AFM) mode proposed here is a new frequency modulation technique performed in scanning force controlled AFM modes like force volume or peak force tapping. It consists of tracking the change in the resonance frequency of an eigenmode of a driven AFM cantilever during scanning as the AFM probe intermittently contacts a surface at a controlled applied maximum force (setpoint). A high speed data capture was used during individual oscillations to obtain detailed contact stiffness-force curve measurements on a two-phase polystyrene/poly(methyl methacrylate) film with sub-micrometer size domains. Through a suitable normalization, the measurements were analyzed by linear fits to provide an improved quantitative characterization of these materials in terms of their elastic moduli and adhesive properties.
本文提出的间歇接触共振原子力显微镜（ICR-AFM）模式是一种在诸如力体积成像或峰值力敲击等扫描力控制的原子力显微镜模式下执行的新频率调制技术。它包括在扫描过程中，当原子力显微镜探针以受控的施加最大力（设定点）间歇接触表面时，跟踪驱动的原子力显微镜悬臂梁本征模式共振频率的变化。在单个振荡过程中使用高速数据采集，以获得具有亚微米尺寸域的两相聚苯乙烯/聚（甲基丙烯酸甲酯）薄膜上详细的接触刚度-力曲线测量结果。通过适当的归一化处理，通过线性拟合对测量结果进行分析，以根据其弹性模量和粘附特性对这些材料进行改进的定量表征。
