Yadav Satyamanyu, Yadav Sudesh
School of Environmental Sciences, Jawaharlal Nehru University, New Mehrauli Road, New Delhi 110067, India.
School of Environmental Sciences, Jawaharlal Nehru University, New Mehrauli Road, New Delhi 110067, India.
J Environ Manage. 2014 Nov 1;144:101-7. doi: 10.1016/j.jenvman.2014.05.022. Epub 2014 Jun 13.
Metal leaching from landfills containing end-of-life or otherwise discarded mobile phones poses a threat to the environment as well as public health. In the present study, the metal toxicity of printed wire boards (PWBs), plastics, liquid crystal displays (LCDs) and batteries of mobile phones was assessed using the Toxicity Characteristics Leaching Procedures (TCLP) and the Waste Extraction Test (WET). The PWBs failed TCLP for Pb and Se, and WET for Pb and Zn. In WET, the two PWB samples for Pb and Zn and the battery samples for Co and Cu failed the test. Furthermore, the PWBS for Ni and the battery samples for Ni and Co failed the WET in their TCLP leachates. Both, Ni and Co are the regulatory metals in only WET and not covered under TCLP. These observations indicate that the TCLP seems to be a more aggressive test than the WET for the metal leaching from the mobile phone parts. The compositional variations, nature of leaching solution (acetate in TCLP and citrate in WET) and the redox conditions in the leaching solution of the PWBs resulted in different order of metals with respect to their amounts of leaching from PWBs in TCLP (Fe > Pb > Zn > Ni > Co > Cu) and WET (Zn > Fe > Ni > Pb > Cu). The metal leaching also varied with the make, manufacturing year and part of the mobile phone tested. PWBs, plastics and batteries should be treated as hazardous waste. Metal leaching, particularly of Se and Pb, from mobile phones can be harmful to the environment and human health. Therefore, a scientifically sound and environmentally safe handling and disposal management system needs to be evolved for the mobile phone disposal.
来自含有报废或其他废弃手机的垃圾填埋场的金属浸出对环境以及公众健康构成威胁。在本研究中，使用毒性特征浸出程序（TCLP）和废物提取试验（WET）评估了手机的印刷线路板（PWB）、塑料、液晶显示器（LCD）和电池的金属毒性。印刷线路板在TCLP中铅和硒的浸出测试未通过，在WET中铅和锌的浸出测试未通过。在WET中，两个印刷线路板样品的铅和锌以及电池样品的钴和铜浸出测试未通过。此外，印刷线路板的镍以及镍和钴的电池样品在TCLP浸出液的WET测试中未通过。镍和钴都是仅在WET中受监管的金属，不在TCLP涵盖范围内。这些观察结果表明，对于手机部件的金属浸出，TCLP似乎比WET是更具侵蚀性的测试。印刷线路板的成分变化、浸出溶液的性质（TCLP中的醋酸盐和WET中的柠檬酸盐）以及浸出溶液中的氧化还原条件导致在TCLP（铁>铅>锌>镍>钴>铜）和WET（锌>铁>镍>铅>铜）中从印刷线路板浸出的金属量的不同顺序。金属浸出也因所测试手机的品牌、制造年份和部件而异。印刷线路板、塑料和电池应作为危险废物处理。手机中的金属浸出，特别是硒和铅的浸出，可能对环境和人类健康有害。因此，需要为手机处置建立一个科学合理且环境安全的处理和处置管理系统。
