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接近毫焦耳级放大器中载波包络相位稳定性的极限。

Approaching the limits of carrier-envelope phase stability in a millijoule-class amplifier.

作者信息

Lücking Fabian, Crozatier Vincent, Forget Nicolas, Assion Andreas, Krausz Ferenc

出版信息

Opt Lett. 2014 Jul 1;39(13):3884-7. doi: 10.1364/OL.39.003884.

Abstract

The demand for ever shorter light pulses presents a challenge to the detection and stabilization of the carrier-envelope phase (CEP) in amplifier systems. Here we present a combination of single-shot detection and a fast actuator that is capable of measuring and correcting the CEP in every single shot emitted by a millijoule-scale, multi-kHz femtosecond laser amplifier. The residual CEP noise within 50 s amounts to 98 mrad rms in-loop (fast detection, 5·10⁵ shots) and 140 mrad out-of-loop (slow detection, 6250 shots), approaching the noise floor of the f-to-2f measurement. Both values represent a twofold improvement of the CEP stability over previously published results in comparable systems.

摘要

对更短光脉冲的需求给放大器系统中载波包络相位(CEP)的检测与稳定带来了挑战。在此,我们展示了一种单次检测与快速致动器相结合的方法,该方法能够测量并校正毫焦耳级、多千赫兹飞秒激光放大器发射的每一个单次脉冲中的CEP。50秒内的残余CEP噪声在环路内(快速检测,5·10⁵次脉冲)为均方根98毫弧度,在环路外(慢速检测,6250次脉冲)为140毫弧度,接近f至2f测量的本底噪声。这两个值均表明,与之前在可比系统中发表的结果相比,CEP稳定性提高了两倍。

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