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Thickness-dependent attraction or repulsion between defects on a thin elastic film.

作者信息

He L H

机构信息

CAS Key Laboratory of Mechanical Behavior and Design of Materials & Institute of Solid State Physics, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China.

出版信息

Phys Rev E Stat Nonlin Soft Matter Phys. 2014 Jun;89(6):062409. doi: 10.1103/PhysRevE.89.062409. Epub 2014 Jun 27.

Abstract

We examine elastic interaction between two defects on one side or two sides of an isotropic thin film. We show that the tangential and normal forces contribute to the interaction in a coupled manner. Our finding is that the attraction or repulsion between two defects exhibiting twofold symmetry is dependent on the film thickness. The result is of particular importance for probing elastic interaction between adherent cells which have been commonly treated as twofold surface defects.

摘要

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