Muramoto Shin
National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
Analyst. 2014 Nov 21;139(22):5868-78. doi: 10.1039/c4an01481b.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to visualize the transport of analyte molecules desorbed onto a silicon wafer collection substrate by desorption electrospray ionization (DESI). The effect of spray incidence angle, tip height, and probe distance on the concentration and the spatial distribution of desorbed analyte molecules were investigated with the objective of identifying DESI operational parameters that provide more reproducible results by achieving steady ion transmission and minimized material loss. An incidence angle between 25° and 35° with respect to the plane of the surface provided the best compromise between maximizing ambient MS signal and achieving the best reliability. Glancing incidence angles provided higher ambient MS signals through a tighter dispersion of the secondary droplet plume, but run-to-run variability of as much as 40%. On the other hand, steeper incidence angles led to a widening of the lateral dispersion of the secondary droplets and decreased analyte desorption. For all incidence angles, shorter probe distances were preferred since the resulting tighter dispersion of the secondary droplets produced higher ion transmission and therefore higher ambient MS signals. Tip height was found to correlate with the spot size (footprint) of the spray on the surface; changing the tip height from (1 to 2 to 3) mm changed the diameter of the spray impact area from (1.3, 1.8, to 2.1) mm, respectively. For shorter probe to MS inlet distances, larger tip heights increased the ambient MS signal due to increased analyte desorption while maintaining a tighter dispersion of the secondary droplet plume. Equally important to optimizing instrument configuration was the understanding that the deposition of a sample onto the surface resulted in a coffee ring, where the diameter was larger than the spot size of the spray. Higher tip heights may be preferred for a more consistent analyte response since all or a large fraction of the analyte could be sampled to reduce variability in ambient MS response. The study showed that ToF-SIMS can be used as a unique tool for characterizing the transport of desorbed analyte molecules for DESI, and potentially offers insight into new interface designs for improved transmission of analyte into the mass spectrometer.
飞行时间二次离子质谱(ToF-SIMS)用于可视化通过解吸电喷雾电离(DESI)解吸到硅片收集基板上的分析物分子的传输。研究了喷雾入射角、针尖高度和探头距离对解吸分析物分子浓度和空间分布的影响,目的是确定通过实现稳定的离子传输和最小化材料损失来提供更可重复结果的DESI操作参数。相对于表面平面25°至35°的入射角在最大化环境质谱信号和实现最佳可靠性之间提供了最佳折衷。掠入射角通过二次液滴羽流的更紧密分散提供更高的环境质谱信号,但每次运行的变化高达40%。另一方面,更陡的入射角导致二次液滴横向分散变宽并降低分析物解吸。对于所有入射角,较短的探头距离是优选的,因为由此产生的二次液滴更紧密分散产生更高的离子传输,因此产生更高的环境质谱信号。发现针尖高度与表面上喷雾的斑点尺寸(足迹)相关;将针尖高度从(1到2到3)mm改变分别将喷雾撞击区域的直径从(1.3、1.8到2.1)mm改变。对于较短的探头到质谱入口距离,较大的针尖高度由于分析物解吸增加而增加了环境质谱信号,同时保持二次液滴羽流的更紧密分散。理解将样品沉积到表面上会导致咖啡环同样重要,其中直径大于喷雾的斑点尺寸。对于更一致的分析物响应,可能优选更高的针尖高度,因为可以对所有或大部分分析物进行采样以减少环境质谱响应中的变异性。该研究表明,ToF-SIMS可作为一种独特工具,用于表征DESI中解吸分析物分子的传输,并有可能为改进分析物传输到质谱仪中的新接口设计提供见解。