Yang J, Li J B, Gong Q H, Teng J H, Hong M H
Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576. Institute of Materials Research and Engineering, Agency for Science, Technology and Research, 3 Research link, Singapore 117602. NUS Environmental Research Institute, National University of Singapore, 5A Engineering Drive 1, #02-01, Singapore 117411.
Nanotechnology. 2014 Nov 21;25(46):465707. doi: 10.1088/0957-4484/25/46/465707. Epub 2014 Oct 31.
Well-ordered silicon nanowires (SiNWs) are applied as surface-enhanced Raman scattering (SERS) substrates. Laser interference lithography is used to fabricate large-area periodic nanostructures. By controlling the reaction time of metal assisted chemical etching, various aspect ratios of SiNWs are generated. Ag nanoparticles are decorated on the substrates via redox reaction to allow a good coverage of Ag over the SiNWs. As the height of the SiNWs increases, the light scattering inside the structures is enhanced. The number of the probing molecules within the detection volume is increased as well. These factors contribute to stronger light-matter interaction and thus lead to higher SERS signal intensity. However, the light trapping effect is more significant for higher SiNWs, which prevents the detection of the SERS signals. An optimized aspect ratio ∼5:1 (1 μm height and 200 nm width) for the SiNW array is found. The well-ordered SiNWs demonstrate better SERS signal intensity and uniformity than the randomly arranged SiNWs.
有序硅纳米线(SiNWs)被用作表面增强拉曼散射(SERS)基底。激光干涉光刻用于制造大面积周期性纳米结构。通过控制金属辅助化学蚀刻的反应时间,可生成不同纵横比的SiNWs。通过氧化还原反应在基底上修饰银纳米颗粒,以使银在SiNWs上实现良好覆盖。随着SiNWs高度的增加,结构内部的光散射增强。检测体积内探测分子的数量也会增加。这些因素有助于增强光与物质的相互作用,从而导致更高的SERS信号强度。然而,对于更高的SiNWs,光捕获效应更为显著,这会妨碍SERS信号的检测。发现SiNW阵列的最佳纵横比约为5:1(高度为1μm,宽度为200nm)。与随机排列的SiNWs相比,有序SiNWs表现出更好的SERS信号强度和均匀性。