Terayama Ryuji, Yamamoto Yuya, Kishimoto Noriko, Maruhama Kotaro, Mizutani Masahide, Iida Seiji, Sugimoto Tomosada
Department of Oral Function and Anatomy, Okayama University Graduate School of Medicine, Dentistry and Pharmaceutical Sciences, 2-5-1 Shikata-cho, Kita-ku, Okayama, 700-8525, Japan,
Exp Brain Res. 2015 Apr;233(4):1201-12. doi: 10.1007/s00221-015-4203-2. Epub 2015 Jan 20.
Previous studies demonstrated that peripheral nerve injury induced excessive nociceptive response of spinal cord dorsal horn neurons and such change has been proposed to reflect the development of neuropathic pain state. The aim of this study was to examine the spinal dorsal horn for convergence of nociceptive input to second-order neurons deafferented by peripheral nerve injury. Double immunofluorescence labeling for c-Fos and phosphorylated extracellular signal-regulated kinase (p-ERK) was performed to detect convergent synaptic input to spinal dorsal horn neurons after the saphenous nerve injury. c-Fos expression and the phosphorylation of ERK were induced by noxious heat stimulation of the hindpaw and by electrical stimulation of the injured or uninjured saphenous nerve, respectively. Within the central terminal field of the saphenous nerve, the number of c-Fos protein-like immunoreactive (c-Fos-IR) cell profiles was significantly decreased at 3 days and returned to the control level by 14 days after the injury. p-ERK immunoreactive (p-ERK-IR) cell profiles were distributed in the central terminal field of the saphenous nerve, and the topographic distribution pattern and number of such p-ERK-IR cell profiles remained unchanged after the nerve injury. The time course of changes in the number of double-labeled cell profiles was similar to that of c-Fos-IR cell profiles after the injury. These results indicate that convergent primary nociceptive input through neighboring intact nerves contributes to increased responsiveness of spinal dorsal horn nociceptive neurons.
以往研究表明,外周神经损伤会诱导脊髓背角神经元产生过度的伤害性反应,并且这种变化被认为反映了神经性疼痛状态的发展。本研究的目的是检查脊髓背角,以确定外周神经损伤后去传入的二级神经元的伤害性输入汇聚情况。采用c-Fos和磷酸化细胞外信号调节激酶(p-ERK)的双重免疫荧光标记,以检测隐神经损伤后脊髓背角神经元的汇聚性突触输入。分别通过后爪的有害热刺激和对损伤或未损伤的隐神经进行电刺激来诱导c-Fos表达和ERK磷酸化。在隐神经的中枢终末区域内,损伤后3天c-Fos蛋白样免疫反应性(c-Fos-IR)细胞轮廓的数量显著减少,到损伤后14天恢复到对照水平。p-ERK免疫反应性(p-ERK-IR)细胞轮廓分布在隐神经的中枢终末区域,神经损伤后此类p-ERK-IR细胞轮廓的拓扑分布模式和数量保持不变。损伤后双标记细胞轮廓数量的变化时间进程与c-Fos-IR细胞轮廓相似。这些结果表明,通过相邻完整神经的汇聚性初级伤害性输入有助于脊髓背角伤害性神经元反应性的增加。