二维扫描聚焦折射率显微镜及其在光纤折射率剖面分析中的应用。

Two-dimensional scanning focused refractive-index microscopy and applications to refractive-index profiling of optical fibers.

作者信息

Wang Xiaowan, Ye Qing, Sun Tengqian, Wang Jin, Deng Zhichao, Mei Jianchun, Zhou Wenyuan, Zhang Chunping, Tian Jianguo

机构信息

The Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, School of Physics and TEDA Applied Physics School, Nankai University, Tianjin 300071, China.

Advanced Technology Institute, Nankai University, Tianjin 300071, China.

出版信息

Rev Sci Instrum. 2015 Jan;86(1):013702. doi: 10.1063/1.4905179.

DOI:10.1063/1.4905179

PMID:25638085

Abstract

The refractive-index profile (RIP) of optical fibers is of fundamental significance in determining critical fiber properties. Here, we present the application of a two-dimensional (2-D) scanning focused refractive-index microscopy (SFRIM) to accurately obtain the 2-D RIP of a graded-index optical fiber. Some modifications are made to SFRIM for better 2-D measurement. Quantitative RIP of the fiber is obtained with derivative total reflection method. The refractive-index accuracy is 0.002. The measured result is in good agreement with theoretical expectation. This method is straightforward, simple, repeatable, and free from signal distortion. This technique is suitable for symmetric and asymmetric optical fibers. The results indicate that this technique can be applied to obtain the RIPs of a wide range of materials and has broad application prospect in many fields.

摘要

光纤的折射率分布（RIP）对于确定光纤的关键特性具有至关重要的意义。在此，我们展示了二维（2-D）扫描聚焦折射率显微镜（SFRIM）在准确获取渐变折射率光纤二维RIP方面的应用。对SFRIM进行了一些改进以实现更好的二维测量。采用导数全反射法获得了光纤的定量RIP。折射率精度为0.002。测量结果与理论预期高度吻合。该方法直接、简单、可重复且无信号失真。此技术适用于对称和非对称光纤。结果表明，该技术可用于获取多种材料的RIP，在许多领域具有广阔的应用前景。