Sun Teng-Qian, Ye Qing, Wang Xiao-Wan, Wang Jin, Deng Zhi-Chao, Mei Jian-Chun, Zhou Wen-Yuan, Zhang Chun-Ping, Tian Jian-Guo
Key Laboratory of Weak-Light Nonlinear Photonics, Ministry of Education, School of physics and TEDA Applied Physics School, Nankai University, Tianjin 300071, China.
Advanced Technology Institute, Nankai University, Tianjin 300071, China.
Sci Rep. 2014 Jul 10;4:5647. doi: 10.1038/srep05647.
We present a novel scanning focused refractive-index microscopy (SFRIM) technique to obtain the refractive index (RI) profiles of objects. The method uses a focused laser as the light source, and combines the derivative total reflection method (DTRM), projection magnification, and scanning technique together. SFRIM is able to determine RIs with an accuracy of 0.002, and the central spatial resolution achieved is 1 µm, which is smaller than the size of the focal spot. The results of measurements carried out on cedar oil and a gradient-refractive-index (GRIN) lens agree well with theoretical expectations, verifying the accuracy of SFRIM. Furthermore, using SFRIM, to the best of our knowledge we have extracted for the first time the RI profile of a periodically modulated photosensitive gelatin sample. SFRIM is the first RI profile-resolved reflected light microscopy technique that can be applied to scattering and absorbing samples. SFRIM enables the possibility of performing RI profile measurements in a variety of applications, including optical waveguides, photosensitive materials and devices, photorefractive effect studies, and RI imaging in biomedical fields.
我们提出了一种新型的扫描聚焦折射率显微镜(SFRIM)技术来获取物体的折射率(RI)分布。该方法使用聚焦激光作为光源,并将导数全反射法(DTRM)、投影放大和扫描技术结合在一起。SFRIM能够以0.002的精度确定折射率,实现的中心空间分辨率为1 µm,小于焦斑尺寸。对雪松油和梯度折射率(GRIN)透镜进行的测量结果与理论预期吻合良好,验证了SFRIM的准确性。此外,据我们所知,使用SFRIM我们首次提取了周期性调制的光敏明胶样品的RI分布。SFRIM是第一种能够解析RI分布的反射光显微镜技术,可应用于散射和吸收样品。SFRIM使得在包括光波导、光敏材料和器件、光折变效应研究以及生物医学领域的RI成像等各种应用中进行RI分布测量成为可能。