CIMAP, CEA-CNRS-ENSICAEN, BP 5133, F-14070 Caen cedex 5, France.
Department of Chemistry, Tokyo Metropolitan University, 1-1 Minamiosawa, Hachiouji-shi, Tokyo 192-0397, Japan.
Phys Rev Lett. 2015 Jan 23;114(3):033201. doi: 10.1103/PhysRevLett.114.033201. Epub 2015 Jan 22.
We provide the experimental evidence that the single electron capture process in slow collisions between O^{3+} ions and neon dimer targets leads to an unexpected production of low-energy electrons. This production results from the interatomic Coulombic decay process, subsequent to inner-shell single electron capture from one site of the neon dimer. Although pure one-electron capture from the inner shell is expected to be negligible in the low collision energy regime investigated here, the electron production due to this process overtakes by 1 order of magnitude the emission of Auger electrons by the scattered projectiles after double-electron capture. This feature is specific to low charge states of the projectile: similar studies with Xe^{20+} and Ar^{9+} projectiles show no evidence of inner-shell single-electron capture. The dependence of the process on the projectile charge state is interpreted using simple calculations based on the classical over the barrier model.
我们提供了实验证据，表明在 O^{3+}离子与氖二聚体靶之间的缓慢碰撞中，单电子俘获过程会导致意想不到的低能电子产生。这种产生源自于内壳层单电子俘获后原子间库仑衰变过程，来自氖二聚体的一个位点。尽管在我们研究的低碰撞能区，预期纯内壳层单电子俘获可忽略不计，但由于该过程产生的电子数量超过了双电子俘获后散射靶的俄歇电子发射数量级 1。这种特征是针对较低荷电态的射弹的：用 Xe^{20+}和 Ar^{9+}射弹进行类似的研究没有显示出内壳层单电子俘获的证据。基于经典的过势垒模型的简单计算，对该过程对射弹荷电态的依赖性进行了解释。
