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用于指令性说谎任务中欺骗行为的脑电图网络与连通性分析

An electroencephalography network and connectivity analysis for deception in instructed lying tasks.

作者信息

Wang Yue, Ng Wu Chun, Ng Khoon Siong, Yu Ke, Wu Tiecheng, Li Xiaoping

机构信息

Neuroengineering Lab, Mechanical Engineering Department, National University of Singapore, Singapore, Singapore.

出版信息

PLoS One. 2015 Feb 13;10(2):e0116522. doi: 10.1371/journal.pone.0116522. eCollection 2015.

Abstract

Deception is an impactful social event that has been the focus of an abundance of researches over recent decades. In this paper, an electroencephalography (EEG) study is presented regarding the cognitive processes of an instructed liar/truth-teller during the time window of stimulus (question) delivery period (SDP) prior to their deceptive/truthful responses towards questions related to authentic (WE: with prior experience) and fictional experience (NE: no prior experience). To investigate deception in non-experienced events, the subjects were given stimuli in a mock interview scenario that induced them to fabricate lies. To analyze the data, frequency domain network and connectivity analysis was performed in the source space in order to provide a more systematic level understanding of deception during SDP. This study reveals several groups of neuronal generators underlying both the instructed lying (IL) and the instructed truth-telling (IT) conditions for both tasks during the SDP. Despite the similarities existed in these group components, significant differences were found in the intra- and inter-group connectivity between the IL and IT conditions in either task. Additionally, the response time was found to be positively correlated with the clustering coefficient of the inferior frontal gyrus (44R) in the WE-IL condition and positively correlated with the clustering coefficient of the precuneus (7L) and the angular gyrus (39R) in the WE-IT condition. However, the response time was found to be marginally negatively correlated with the clustering coefficient of the secondary auditory cortex (42L) in the NE-IL condition and negatively correlated with the clustering coefficient of the somatosensory association cortex (5L, R) in the NE-IT condition. Therefore, these results provide complementary and intuitive evidence for the differences between the IL and IT conditions in SDP for two types of deception tasks, thus elucidating the electrophysiological mechanisms underlying SDP of deception from regional, inter-regional, network, and inter-network scale analyses.

摘要

欺骗是一个有影响力的社会事件,在近几十年一直是大量研究的焦点。本文呈现了一项脑电图(EEG)研究,该研究关注在有指导的说谎者/说实话者对与真实经历(WE:有先前经验)和虚构经历(NE:无先前经验)相关问题给出欺骗性/真实回答之前的刺激(问题)呈现期(SDP)的认知过程。为了研究非经验性事件中的欺骗,在模拟面试场景中给予受试者刺激,促使他们编造谎言。为了分析数据,在源空间进行频域网络和连接性分析,以便在SDP期间对欺骗提供更系统层面的理解。本研究揭示了在SDP期间,两种任务的有指导说谎(IL)和有指导说实话(IT)条件下几组神经元发生器。尽管这些组成分存在相似性,但在任何一项任务中,IL和IT条件之间的组内和组间连接性都发现了显著差异。此外,发现在WE - IL条件下反应时间与额下回(44R)的聚类系数呈正相关,在WE - IT条件下与楔前叶(7L)和角回(39R)的聚类系数呈正相关。然而,发现在NE - IL条件下反应时间与次级听觉皮层(42L)的聚类系数呈微弱负相关,在NE - IT条件下与体感联合皮层(5L,R)的聚类系数呈负相关。因此,这些结果为两种欺骗任务在SDP中IL和IT条件之间的差异提供了补充性和直观性证据,从而从区域、区域间、网络和网络间尺度分析阐明了欺骗性SDP背后的电生理机制。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f0b7/4332664/77373c2dc639/pone.0116522.g001.jpg

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