Arima Eiji, Naitoh Yoshitaka, Li Yan Jun, Yoshimura Satoru, Saito Hitoshi, Nomura Hikaru, Nakatani Ryoichi, Sugawara Yasuhiro
Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita 565-0871, Japan.
Nanotechnology. 2015 Mar 27;26(12):125701. doi: 10.1088/0957-4484/26/12/125701. Epub 2015 Mar 4.
In magnetic force microscopy (MFM), the tip-sample distance should be reduced to analyze the microscopic magnetic domain structure with high spatial resolution. However, achieving a small tip-sample distance has been difficult because of superimposition of interaction forces such as van der Waals and electrostatic forces induced by the sample surface. In this study, we propose a new method of MFM using ferromagnetic resonance (FMR) to extract only the magnetic field near the sample surface. In this method, the magnetization of a magnetic cantilever is modulated by FMR to separate the magnetic field and topographic structure. We demonstrate the modulation of the magnetization of the cantilever and the identification of the polarities of a perpendicular magnetic medium.
在磁力显微镜（MFM）中，应减小针尖与样品之间的距离，以便以高空间分辨率分析微观磁畴结构。然而，由于样品表面诱导的诸如范德华力和静电力等相互作用力的叠加，实现较小的针尖与样品之间的距离一直很困难。在本研究中，我们提出了一种利用铁磁共振（FMR）的新型MFM方法，以仅提取样品表面附近的磁场。在该方法中，通过FMR调制磁性悬臂的磁化，以分离磁场和形貌结构。我们展示了悬臂磁化的调制以及垂直磁介质极性的识别。
