Karahka Markus, Kreuzer H J
Department of Physics and Atmospheric Science, Dalhousie University, Halifax, N.S. Canada B3H 3J5.
Department of Physics and Atmospheric Science, Dalhousie University, Halifax, N.S. Canada B3H 3J5.
Ultramicroscopy. 2015 Dec;159 Pt 2:156-61. doi: 10.1016/j.ultramic.2015.03.011. Epub 2015 Mar 20.
We look at the new challenges associated with Atom Probe Tomography of insulators and semiconductors with regard to local fields inside and on the surface of such materials. The theoretical discovery that in high fields the band gap in these materials is drastically reduced to the point where at the evaporation field strength it vanishes will be crucial in our discussion. To understand Atom Probe results on the field evaporation of insulators and semiconductors we use density functional theory on ZnO clusters to follow the structural and electronic changes during field evaporation and to obtain potential energy curves, HOMO-LUMO gaps, field distributions, desorption pathways and fragments, dielectric constants, and polarizabilities. We also examine the effects of electric field reversal on the evaporation of ZnO and compare the results with Si.
我们着眼于与绝缘体和半导体的原子探针断层扫描相关的新挑战,这些挑战涉及此类材料内部和表面的局部场。理论发现,在高场中这些材料的带隙会急剧减小,直至在蒸发场强时消失,这一发现对我们的讨论至关重要。为了理解绝缘体和半导体场蒸发的原子探针结果,我们对氧化锌团簇使用密度泛函理论,以跟踪场蒸发过程中的结构和电子变化,并获得势能曲线、最高占据分子轨道-最低未占据分子轨道能隙、场分布、解吸途径和碎片、介电常数以及极化率。我们还研究了电场反转对氧化锌蒸发的影响,并将结果与硅进行比较。