Kim Dae-Yeon, Seo Jong-Wook
Opt Express. 2015 Jan 26;23(2):1063-72. doi: 10.1364/OE.23.001063.
We propose an accurate and easy-to-use three-dimensional measurement method using a diffuser plate to analyze the scattering characteristics of optical films. The far-field radiation pattern of light scattered by the optical film is obtained from the illuminance pattern created on the diffuser plate by the light. A mathematical model and calibration methods were described, and the results were compared with those obtained by a direct measurement using a luminance meter. The new method gave very precise three-dimensional polarization-dependent scattering characteristics of scattering polarizer films, and it can play an effective role in developing high performance polarization-selective screens for 3D display applications.
我们提出了一种精确且易于使用的三维测量方法,该方法使用漫射板来分析光学薄膜的散射特性。通过光学薄膜散射的光的远场辐射图案是从由光在漫射板上产生的照度图案获得的。描述了数学模型和校准方法,并将结果与使用亮度计直接测量获得的结果进行了比较。新方法给出了散射偏振器薄膜非常精确的三维偏振相关散射特性,并且它可以在开发用于3D显示应用的高性能偏振选择屏幕中发挥有效作用。