Gupta Rekha, Chaudhary Sujeet, Kotnala R K
†CSIR-National Physical Laboratory, New Delhi 110012, India.
‡Department of Physics, Indian Institute of Technology Delhi, New Delhi 110016, India.
ACS Appl Mater Interfaces. 2015 Apr 29;7(16):8472-9. doi: 10.1021/am509055f. Epub 2015 Apr 17.
Bilayer thin films of BiFeO3-BaTiO3 at different thicknesses of BiFeO3 were prepared by RF-magnetron sputtering technique. A pure phase polycrystalline growth of thin films was confirmed from XRD results. Significantly improved ferroelectric polarization (2Pr ∼ 30 μC/cm(2)) and magnetic moment (Ms ∼ 33 emu/cc) were observed at room temperature. Effect of ferroelectric polarization on current conduction across the interface has been explored. Accumulation and depletion of charges at the bilayer interface were analyzed by current-voltage measurements which were further confirmed from hysteretic dynamic resistance and capacitance voltage profiles. Magnetoelectric coupling due to induced charges at grain boundaries of bilayer interface was further investigated by room temperature magnetocapacitance analysis. A room temperature magnetocapacitance was found to originate from induced charge at the bilayer interface which can be manipulated by varying the thickness of BFO to obtain higher ME coupling coefficient. Dynamic magnetoelectric coupling was investigated, and maximum longitudinal magnetoelectric coupling was observed to be 61 mV/cm·Oe at 50 nm thickness of BiFeO3. The observed magnetoelectric properties are potentially useful for novel room temperature magnetoelectric and spintronic device applications.
采用射频磁控溅射技术制备了不同厚度BiFeO₃的BiFeO₃ - BaTiO₃双层薄膜。XRD结果证实了薄膜的纯相多晶生长。在室温下观察到铁电极化(2Pr ∼ 30 μC/cm²)和磁矩(Ms ∼ 33 emu/cc)显著提高。研究了铁电极化对跨界面电流传导的影响。通过电流 - 电压测量分析了双层界面处电荷的积累和耗尽,这从滞后动态电阻和电容电压曲线中得到了进一步证实。通过室温磁电容分析进一步研究了双层界面晶界处感应电荷引起的磁电耦合。发现室温磁电容源于双层界面处的感应电荷,可通过改变BFO的厚度来操纵以获得更高的磁电耦合系数。研究了动态磁电耦合,在BiFeO₃厚度为50 nm时观察到最大纵向磁电耦合为61 mV/cm·Oe。所观察到的磁电性能对于新型室温磁电和自旋电子器件应用可能是有用的。