Yen Shun-Tung, Chung Pei-Kang
Appl Opt. 2015 Feb 1;54(4):663-8. doi: 10.1364/AO.54.000663.
We propose a scheme to extract the refractive index and the extinction coefficient of dielectrics. The extraction needs only a reflectance spectrum with reliable successive maxima of fringing oscillations measured from a dielectric film that is either freestanding or on metal. With the film thickness known in advance, we determine the refractive index spectrum from the fringing oscillation periods and then the extinction coefficient spectrum from the upper envelope. The method is demonstrated to work well for GaAs and Ge.
我们提出了一种提取电介质折射率和消光系数的方案。该提取仅需要从独立的或置于金属上的电介质薄膜测得的具有可靠连续边缘振荡最大值的反射光谱。在预先知道薄膜厚度的情况下，我们从边缘振荡周期确定折射率光谱，然后从上包络确定消光系数光谱。该方法已被证明对砷化镓和锗有效。
