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辐射测量法测量发射率的综述。

Survey of emissivity measurement by radiometric methods.

作者信息

Honner M, Honnerová P

出版信息

Appl Opt. 2015 Feb 1;54(4):669-83. doi: 10.1364/AO.54.000669.

DOI:10.1364/AO.54.000669
PMID:25967774
Abstract

A survey of the state of the art in the field of spectral directional emissivity measurements by using radiometric methods is presented. Individual quantity types such as spectral, band, or total emissivity are defined. Principles of emissivity measurement by various methods (direct and indirect, and calorimetric and radiometric) are discussed. The paper is focused on direct radiometric methods. An overview of experimental setups is provided, including the design of individual parts such as the applied reference sources of radiation, systems of sample clamping and heating, detection systems, methods for the determination of surface temperature, and procedures for emissivity evaluation.

摘要

本文介绍了利用辐射测量方法进行光谱定向发射率测量领域的技术现状。定义了诸如光谱发射率、波段发射率或总发射率等各种量的类型。讨论了通过各种方法(直接和间接、量热法和辐射测量法)测量发射率的原理。本文重点关注直接辐射测量法。提供了实验装置的概述,包括各个部件的设计,如应用的辐射参考源、样品夹持和加热系统、检测系统、表面温度测定方法以及发射率评估程序。

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